X-ray Photoelectron Spectroscopy

XPS, frequently named also ESCA [Electron Spectroscopy for Chemical Analysis] is a highly surface sensitive chemical analysis technique, usually for solid samples. In XPS samples are irradiated with soft X-ray source (~1.5 KeV) under Ultra High Vacuum conditions (~ 10^-10-10^-9 torr), while their ejected photoelectrons are (kinetic) energy analyzed. The analysis provides quantitative and qualitative chemical analysis for the first 10-100 A of the sample. The chemical information may include oxidation state, chemical environment, spin state, bonding, organic functional groups and more. Sample uniformity and stratification, as well as thin film thickness can also be deduced from the spectra.  

In Bar Ilan University we have a Kratos axis HS spectrometer, equipped with dual (Mg/Al) and monochromatic (Al) source and mini ion gun. High resolution spectra are acquired for conducting and non conducting samples, the later ones with low electron flood gun for charge neutralization.

Data manipulation and interpretation is carried out with OEM Vision 2 software.